The XY Scanning Slits Beam Profiler is a system to measure the intensity of charged particle beams and map the variation along two transverse axes. The probe in the system uses a plate with two perpendicular slots to intercept the beam. A small portion of the beam passes through the slots into integral Faraday cups mounted on the back side of the plate. The plate is moved across the beam to scan different cross sections. Shielded cables transmit the current generated by the capture of the charged particles in the cups to the controller where the signal is converted to voltage by a two-channel transimpedance amplifier and then recorded using an analog-to-digital converter and data acquisition software. A graphical user interface plots the results of the scan and allows the operator to control parameters such as the spatial resolution and scan speed. By using a water-cooled plate with a refractory metal coating to intercept the largest portion of the beam, the scanner is able tomeasure beams with greater power densities than typical wire scanners.

• Scan X and Y beam profiles with single probe
• Greater maximum power density than common wire scanners
• No bias power supply required
• Remote operation with text-based TCP/IP commands